中国科学技术大学学报 ›› 2020, Vol. 50 ›› Issue (12): 1516-1524.DOI: 10.3969/j.issn.0253-2778.2020.12.009

• 科研论文 • 上一篇    

应用修正Stoney公式原位测量硅薄膜电极中的锂化应力

  

  1. 中国科学院材料力学行为和设计重点实验室,中国科学技术大学近代力学系,安徽合肥230027
  • 出版日期:2020-12-30 发布日期:2021-03-04

Modified Stoney formula for in-situ lithiation stress measurement in thin-film Si electrode

  1. CAS Key Laboratory of Mechanical Behavior and Design of Materials, Department of Modern Mechanics, University of Science and Technology of China, Hefei 230027, China
  • Online:2020-12-30 Published:2021-03-04
  • Contact: Ni Yong is a Professor of Mechanics at University of Science and Technology of China ( USTC). He received his B. S. degree in Theoretical and Applied Mechanics in 2000 and Ph. D. degree in Solid Mechanics in 2004, both from USTC. From 2005 to 2009, he worked in Hong Kong University, National Institute of Standard and Technology, and Rutgers University as a visiting scholar and Research Associate, respectively. He joined the USTC faculty as a Professor of Mechanics in 2009. His research mainly focuses on mechanics of microstructured materials.
  • About author:Liu Peilin is a master student under the supervision of Prof. Ni Yong at University of Science and Technology of China (USTC). She received her bachelor’ s degree in Engineering Mechanics from North China University of Water Conservancy and Hydropower in 2014. Her research mainly focuses on the in- situ measurement of lithiation stress in thin-film Si electrode.
  • Supported by:

    The work is supported by the National Natural Science Foundation of China (11672285), the Strategic Priority Research Program of the Chinese Academy of Sciences ( XDB22040502 ), China Postdoctoral Science Foundation (2018M642532), the Fundamental Research Funds for the Central Universities ( WK2090050046), the Collaborative Innovation Center of Suzhou Nano Science and Technology, and the Fundamental Research Funds for the Central Universities. Conflict of interest The authors declare no conflict of interest.

摘要:

结合Stoney公式的多光臂应力测量方法能够有效检测出薄膜电极在充放电过程中的平均应力.然而,经典Stoney公式仅适用于低应力水平的情况.运用修正的Stoney公式考虑了硅电极材料力学性质的变化和基底曲率剧烈 变化情况下电极薄膜中应力的演化规律.基于应力和扩散相互耦合的三维非线性有限元模型,验证了修正Stoney公 式的准确性.进一步,讨论了曲率分叉出现的条件,确保使用修正的Stoney公式时避免出现曲率分叉行为.

关键词:  , 修正Stoney公式, 有限元, 分叉, 应力, 塑性, 大变形

Abstract:

The multi-beam optical stress sensor method combined with Stoney equation is an effective approach to measure in-situ average stress in thin film electrodes upon lithiation / delithiation. However, the classic Stoney formula is applicable only at low stress states. A modified Stoney formula for stress measurement in thin-film Si electrodes was applied to account for the combined effects of the Li concentration-dependent material properties and large substrate curvature change. The numerical results based on three-dimensional non-linear finite element model for the full coupling of large deformation and Li diffusion confirm the accuracy of the modified Stoney equation. Further, a critical condition for the curvature bifurcation was discussed, which should be avoid when using the modified Stoney equation.

Key words: modified stoney formula, finite element analysis, bifurcation, stress, plasticity, large deformation

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